• DocumentCode
    343218
  • Title

    Synthesis of SiC using ion beam and PECVD

  • Author

    Yang, Liun ; Chen, Changqing ; Ren, Congxin ; Yan, Jinlong ; Chen, Xueliang

  • Author_Institution
    Inst. of Metall., Acad. Sinica, Shanghai, China
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    811
  • Lastpage
    814
  • Abstract
    SiC films were synthesized by ion implantation, ion beam enhanced deposition, reactive ion beam sputtering and plasma enhanced chemical vapor deposition (PECVD). P-type (100) Si was implanted with 60 keV C + at different temperatures to form a SiC buried layer. Implanting at 680°C, there are two apparent XRD peaks due to the β-SiC(200) and (400) reflections in as implanted samples. Ion beam enhanced deposition could be adopt to prepare amorphous SiC films containing SiC bonds whose absorption bands located at 800 cm-1 . Hydrogenated amorphous SiC films were synthesized by reactive ion beam sputtering deposition. Meanwhile, hydrogenate amorphous SiC film which can exhibit green photoluminescence at room temperature were prepared by PECVD
  • Keywords
    amorphous semiconductors; bonds (chemical); buried layers; hydrogen; ion beam assisted deposition; ion implantation; noncrystalline structure; photoluminescence; plasma CVD; semiconductor growth; semiconductor thin films; silicon compounds; sputter deposition; wide band gap semiconductors; β-SiC; 20 C; 680 C; 800 cm-1; P-type (100) Si; PECVD; SiC; SiC bonds; SiC buried layer; SiC:H; XRD peaks; amorphous SiC films; green photoluminescence; hydrogenated amorphous SiC films; ion beam enhanced deposition; ion implantation; plasma enhanced chemical vapor deposition; reactive ion beam sputtering; room temperature; synthesis; Amorphous materials; Chemical vapor deposition; Ion beams; Ion implantation; Optical films; Plasma chemistry; Plasma immersion ion implantation; Plasma temperature; Silicon carbide; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-4306-9
  • Type

    conf

  • DOI
    10.1109/ICSICT.1998.786161
  • Filename
    786161