DocumentCode :
3432520
Title :
The basic process parameters and reliability evaluation results for the new IC-Card packaging method by using transfer molding
Author :
Sakurai, Keizou ; Inui, Katsunori
Author_Institution :
Component Technol. Dev., IBM Japan Ltd., Shiga, Japan
fYear :
1995
fDate :
4-6 Dec 1995
Firstpage :
355
Lastpage :
359
Abstract :
The IC-Card demand has been increasing according to mobile PC market or other electrical product growth, of which main fascination is to be able to obtain easily the additional functions. On the other hand, the IC-Card packaging technology is required to investigate the larger parts mount space and the stronger structure. Generally, the current IC-Card packaging uses the metal cover and plastic frame. New developed IC-Card packaging in this paper does not use such as a metal cover and plastic frame, but only transfer mold technology as its process. The evaluation results and superiorities of THE NEW PACKAGING are reported in this paper comparing JEIDA standards and current other packaging performances
Keywords :
integrated circuit packaging; integrated circuit reliability; smart cards; IC-Card packaging; electrical product; mobile PC; process parameters; reliability; transfer molding; Assembly; Performance evaluation; Plastic packaging; Product design; Resins; Space technology; Stress; Testing; Transfer molding; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
Conference_Location :
Omiya
Print_ISBN :
0-7803-3622-4
Type :
conf
DOI :
10.1109/IEMT.1995.541061
Filename :
541061
Link To Document :
بازگشت