Title :
Modeling Techniques for Formal Verification of BIST Controllers and Their Integration into SOC Designs
Author :
Roy, Subir K. ; Parekhji, Rubin A.
Author_Institution :
Texas Instrum. (India) Pvt. Ltd., Bangalore
Abstract :
This paper describes the methods and challenges for modeling BIST logic in complex SoCs to enable their verification using formal techniques. The main contributions of this paper are: (a) application of symbolic model checking to BIST logic verification, (b) abstraction and modeling of sequential blocks such as memories, data-loggers, scan chains and LFSRs to enable property based formal verification, (c) automated generation of re-usable hookup logic properties, and (d) experimental results to highlight the benefits of the proposed techniques
Keywords :
built-in self test; formal verification; logic testing; system-on-chip; BIST controllers; BIST logic verification; SOC designs; automatic property generation; controller verification; formal verification; memory modeling; modeling techniques; sequential blocks; sequential modeling; symbolic model checking; Automatic generation control; Automatic testing; Built-in self-test; Circuit testing; Formal verification; Logic design; Logic testing; Read-write memory; Signal generators; Test pattern generators;
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-7695-2762-0
DOI :
10.1109/VLSID.2007.112