Title :
Spatial coherence characterization of EUV undulator radiation
Author :
Chang, Chang ; Naulleau, Patrick ; Anderson, Erik H. ; Attwood, David T.
Author_Institution :
Center for X-ray Opt., California Univ., Berkeley, CA, USA
Abstract :
Summary form only given. Coherent radiation is readily available at EUV wavelengths due to the advent of undulator beamlines at synchrotron radiation facilities such as the advanced light source (ALS) at Berkeley. Here we present the results of the coherence characterization of an undulator beamline as measured at the image plane of the Kirkpatrick-Baez system used to re-image the undulator source. The measurement presented here is an implementation of the classic Thompson and Wolf experiment for measuring spatial coherence properties
Keywords :
X-ray optics; light coherence; optical images; synchrotron radiation; undulator radiation; Berkeley; EUV undulator radiation; EUV wavelengths; Kirkpatrick-Baez system; advanced light source; classic Thompson and Wolf experiment; coherence characterization; coherent radiation; image plane; spatial coherence characterization; spatial coherence properties; synchrotron radiation; undulator beamline; undulator beamlines; undulator source reimaging; Biomembranes; Computer science; Electron beams; Etching; Interference; Laboratories; Spatial coherence; Ultraviolet sources; Undulators; Wavelength measurement;
Conference_Titel :
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-5634-9
DOI :
10.1109/LEOS.1999.813471
