DocumentCode
3432777
Title
Controllability-driven Power Virus Generation for Digital Circuits
Author
Najeeb, K. ; Gururaj, Karthik ; Kamakoti, V. ; Vedula, Vivekanand M.
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Madras, Chennai
fYear
2007
fDate
6-10 Jan. 2007
Firstpage
407
Lastpage
412
Abstract
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The power virus problem involves finding input vectors that cause maximum dynamic power dissipation (maximum toggles) in circuits. In this paper, an approach for power virus generation for both combinational and sequential circuits is presented. The basic intuition behind the approach is to use the 0- and 1- controllability measures of the gate outputs in the circuit to guide the D-algorithm. The proposed technique was employed on the ISCAS´85 and ISCAS´89 circuits. The results of the above show a significant increase in power dissipation when compared to the best known existing techniques reported in the literature
Keywords
CMOS logic circuits; automatic test pattern generation; combinational circuits; sequential circuits; CMOS circuits; D-algorithm; automatic test pattern generation; combinational circuits; controllability-driven power virus generation; digital circuits; fanout free regions; maximum dynamic power dissipation; maximum toggles; peak power estimation; sequential circuits; Capacitance; Circuit testing; Clocks; Digital circuits; Power dissipation; Power engineering and energy; Power generation; Power system reliability; Reliability engineering; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location
Bangalore
ISSN
1063-9667
Print_ISBN
0-7695-2762-0
Type
conf
DOI
10.1109/VLSID.2007.55
Filename
4092078
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