• DocumentCode
    3432947
  • Title

    Model Based Test Generation for Microprocessor Architecture Validation

  • Author

    Kodakara, S.V. ; Mathaikutty, Deepak A. ; Dingankar, Ajit ; Shukla, Sandeep ; Lilja, David

  • Author_Institution
    Minnesota Univ., Minneapolis, MN
  • fYear
    2007
  • fDate
    Jan. 2007
  • Firstpage
    465
  • Lastpage
    472
  • Abstract
    Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used in simulation based validation, like simulators and test generators, to validate the system, architecture, microcode, and RTL abstractions of the processor, were manually derived from the specification document. The incomplete informal specification document along with manual translation introduces inconsistency and bugs in the validation collaterals, resulting in increased cost and time to validate the processor. We envision a novel metamodeling based microprocessor modeling and validation environment (MMV) to address this problem. MMV provides a language independent modeling environment to describe the processor at various abstraction levels, a refinement flow to consistently move from one abstraction to the next lower abstraction and code generators to automatically generate the validation collaterals from the models. As a first step towards our vision, in this paper, we describe architectural modeling in MMV and automatic generation of random and coverage directed test suites from the models. We demonstrate the practicality of our approach for validating real world instruction set architectures (ISA) by modeling and generating test cases for eight complex instructions from Intel1 reg virtualization technology
  • Keywords
    automatic test pattern generation; formal verification; instruction sets; microprocessor chips; Intel1 virtualization technology; architectural modeling; automatic test generation; code generators; coverage directed test; functional validation; instruction set architectures; language independent modeling environment; metamodeling; microprocessor architecture validation; microprocessor modeling and validation environment; model based test generation; refinement flow; simulation based validation; specification document; validation collaterals; Analytical models; Computer bugs; Cost function; Microprocessors; Natural languages; Product development; Testing; Time to market; Trademarks; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-2762-0
  • Type

    conf

  • DOI
    10.1109/VLSID.2007.108
  • Filename
    4092087