Title :
A test circuit for measuring MOSFET threshold voltage mismatch
Author :
Terada, Kazuo ; Eimitsu, Masatomo
Author_Institution :
Fac. of Inf. Sci., Hiroshima City Univ., Japan
Abstract :
A new test circuit is proposed for evaluating MOSFET threshold voltage mismatch. This test circuit consists of many parallel-connected unit cells, in which two MOSFETs are serially-connected with each other and the node between them is connected to common wiring through a switch. The threshold voltage mismatch for the two MOSFETs is derived from the DC currents flowing through this test circuit. Experimental results confirm the merit of this test circuit.
Keywords :
CMOS integrated circuits; MOSFET; electric current; integrated circuit testing; semiconductor device measurement; voltage measurement; DC currents; MOSFET threshold voltage mismatch measurement; common wiring switch; parallel-connected unit cells; serially-connected MOSFET pair; test circuit; Circuit testing; Intrusion detection; Large scale integration; MOSFET circuits; Switches; Switching circuits; Threshold voltage; Virtual manufacturing; Voltage measurement; Wiring;
Conference_Titel :
Microelectronic Test Structures, 2003. International Conference on
Print_ISBN :
0-7803-7653-6
DOI :
10.1109/ICMTS.2003.1197466
