• DocumentCode
    3433118
  • Title

    New estimation method of wetting and surface tension by measuring area of spreading solder in flux atmosphere based on ellipse approximation of Sessile drop configurations

  • Author

    Simokawa, H. ; Lee, Chahn ; Yamamoto, Ken´ichi ; Soga, Tasao

  • Author_Institution
    Production Eng. Res. Lab., Hitachi Ltd., Yokohama, Japan
  • fYear
    1995
  • fDate
    4-6 Dec 1995
  • Firstpage
    421
  • Lastpage
    424
  • Abstract
    A method for analyzing the wetting behavior which allows estimation of the movement path and final form of molten solder has been developed. This method is based on an energy analysis which considers the total balance, as opposed to the local balance contact angle method used conventionally for analyzing wetting behavior. In this report, the method is applied to the spreading of solder balls, and the effects of physical properties on wetting behavior are examined. It is found that the physical property which influences the wetting behavior the most is the ratio of wetting tension to surface tension, and this ratio is suitable as a parameter for analyzing soldering defects such as solder bridges
  • Keywords
    contact angle; soldering; surface mount technology; surface tension; wetting; SMT; Sessile drop configurations; electronic packaging; ellipse approximation; energy analysis; estimation method; flux atmosphere; molten solder; movement path; physical properties; solder balls; solder bridges; soldering defects analysis; spreading solder area measurement; surface tension; total balance contact angle method; wetting behavior; wetting tension; Area measurement; Bridge circuits; Electronics packaging; Equations; Laboratories; Lead; Production engineering; Soldering; Solids; Surface tension;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
  • Conference_Location
    Omiya
  • Print_ISBN
    0-7803-3622-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.541076
  • Filename
    541076