• DocumentCode
    3433181
  • Title

    IEC 801-4 - EFT transients

  • Author

    Lutz, M.

  • Author_Institution
    Haefely, Inc.
  • fYear
    1994
  • fDate
    1994
  • Keywords
    Circuit testing; Electromagnetic compatibility; Equivalent circuits; IEC standards; Immunity testing; Interference; Shape; Sparks; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SCV EMC '94, IEEE
  • Type

    conf

  • DOI
    10.1109/SCVEMC.1994.675326
  • Filename
    675326