Title :
An overview of fault models and testing approaches for reversible logic
Author_Institution :
Dept. of Math & Comput. Sci., Univ. of Lethbridge, Lethbridge, AB, Canada
Abstract :
Reversible logic has been proposed as one solution to the problem of ever increasing power consumption. Work in areas such as synthesis techniques in reversible logic is growing, as is work on testing approaches. Numerous fault models have been proposed, but many researchers are still utilising models proposed for traditional logic. We provide an overview of the various fault models and testing approaches for reversible logic, as well as highlighting important results and comparisons/connections between the various models.
Keywords :
fault diagnosis; fault tolerance; logic circuits; logic gates; power consumption; fault models; power consumption; reversible logic; synthesis techniques; testing approaches; traditional logic; Circuit faults; Integrated circuit modeling; Logic gates; Quantum computing; Testing; Vectors; Wires;
Conference_Titel :
Communications, Computers and Signal Processing (PACRIM), 2013 IEEE Pacific Rim Conference on
Conference_Location :
Victoria, BC
DOI :
10.1109/PACRIM.2013.6625461