DocumentCode
3433407
Title
An overview of fault models and testing approaches for reversible logic
Author
Rice, J.E.
Author_Institution
Dept. of Math & Comput. Sci., Univ. of Lethbridge, Lethbridge, AB, Canada
fYear
2013
fDate
27-29 Aug. 2013
Firstpage
125
Lastpage
130
Abstract
Reversible logic has been proposed as one solution to the problem of ever increasing power consumption. Work in areas such as synthesis techniques in reversible logic is growing, as is work on testing approaches. Numerous fault models have been proposed, but many researchers are still utilising models proposed for traditional logic. We provide an overview of the various fault models and testing approaches for reversible logic, as well as highlighting important results and comparisons/connections between the various models.
Keywords
fault diagnosis; fault tolerance; logic circuits; logic gates; power consumption; fault models; power consumption; reversible logic; synthesis techniques; testing approaches; traditional logic; Circuit faults; Integrated circuit modeling; Logic gates; Quantum computing; Testing; Vectors; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Computers and Signal Processing (PACRIM), 2013 IEEE Pacific Rim Conference on
Conference_Location
Victoria, BC
ISSN
1555-5798
Type
conf
DOI
10.1109/PACRIM.2013.6625461
Filename
6625461
Link To Document