• DocumentCode
    3433407
  • Title

    An overview of fault models and testing approaches for reversible logic

  • Author

    Rice, J.E.

  • Author_Institution
    Dept. of Math & Comput. Sci., Univ. of Lethbridge, Lethbridge, AB, Canada
  • fYear
    2013
  • fDate
    27-29 Aug. 2013
  • Firstpage
    125
  • Lastpage
    130
  • Abstract
    Reversible logic has been proposed as one solution to the problem of ever increasing power consumption. Work in areas such as synthesis techniques in reversible logic is growing, as is work on testing approaches. Numerous fault models have been proposed, but many researchers are still utilising models proposed for traditional logic. We provide an overview of the various fault models and testing approaches for reversible logic, as well as highlighting important results and comparisons/connections between the various models.
  • Keywords
    fault diagnosis; fault tolerance; logic circuits; logic gates; power consumption; fault models; power consumption; reversible logic; synthesis techniques; testing approaches; traditional logic; Circuit faults; Integrated circuit modeling; Logic gates; Quantum computing; Testing; Vectors; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Computers and Signal Processing (PACRIM), 2013 IEEE Pacific Rim Conference on
  • Conference_Location
    Victoria, BC
  • ISSN
    1555-5798
  • Type

    conf

  • DOI
    10.1109/PACRIM.2013.6625461
  • Filename
    6625461