Title :
2012 IEEE International Integrated Reliability Workshop (IIRW 2012)
Abstract :
The following topics are dealt with: BTI; resistive memory; advanced gate stack; product reliability; circuit reliability; BEoL; flash memory; bias temperature instability; PID; transistors; and III-V devices.
Keywords :
III-V semiconductors; circuit reliability; flash memories; transistors; BEoL; BTI; III-V devices; PID; advanced gate stack; bias temperature instability; circuit reliability; flash memory; product reliability; resistive memory; transistors;
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
Conference_Location :
South Lake Tahoe, CA
Print_ISBN :
978-1-4673-2749-7
DOI :
10.1109/IIRW.2012.6468898
