DocumentCode
3434314
Title
A robust parameter extraction method for diode with series resistance
Author
Wong, Hei ; Lam, W.H.
Author_Institution
Dept. of Electron. Eng., City Univ., Kowloon, China
fYear
2001
fDate
2001
Firstpage
38
Lastpage
41
Abstract
This work reports a novel model parameter extraction method for diodes with the presence of series resistance. Using the proportional difference of applied voltages and the least square line method, the ideality factor and series resistance can be determined uniquely. Several different kinds of diodes from signal detector to power diode are used in the testing. Results show that the proposed method is simple, robust and accurate
Keywords
electric resistance; power semiconductor diodes; semiconductor device measurement; semiconductor device models; semiconductor diodes; diode; diode testing; ideality factor; least square line method; model parameter extraction method; power diode; proportional applied voltage difference; robust parameter extraction method; series resistance; signal detector diode; Breakdown voltage; Calibration; Cities and towns; Electrical resistance measurement; Equations; Least squares methods; Parameter extraction; Robustness; SPICE; Semiconductor diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location
Hong Kong
Print_ISBN
0-7803-6714-6
Type
conf
DOI
10.1109/HKEDM.2001.946913
Filename
946913
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