DocumentCode :
3434431
Title :
Characterization of immobilized DNA probes on the surface of silicon compatible materials
Author :
Wen, Xu ; Mei, Xue ; Lenigk, Ralf ; Carles, Maria ; Sucher, NIkolaus J. ; Ip, Nancy Y. ; Chan, Mansun
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
fYear :
2001
fDate :
2001
Firstpage :
60
Lastpage :
63
Abstract :
In this paper, the objectives and methodologies of deoxyribonucleic acid (DNA) analysis based on micro arrays produced by microelectronic fabrication technology is reviewed. The important issue of material compatibility between DNA material and silicon based material is addressed. With a special surface treatment, DNA probes have been successfully attached (or immobilized) on the surface of silicon compatible materials (mainly silicon dioxide). Through the use of optical labels that emit optical fluorescence under the illumination of a UV light source, the number of DNA probes immobilized on the silicon dioxide surface can be quantified. The results are further analyzed with atomic force microscopy to visualize the surface conditions. The successful immobilization of DNA probes on silicon wafers is very important for the fabrication of DNA chips for DNA analysis
Keywords :
DNA; atomic force microscopy; biological techniques; biosensors; chemical sensors; electric sensing devices; fluorescence; probes; surface treatment; ultraviolet radiation effects; DNA analysis; DNA chip fabrication; DNA material; DNA probe attachment; DNA probe immobilization; DNA probes; Si; SiO2; UV light source illumination; atomic force microscopy; deoxyribonucleic acid; immobilized DNA probes; material compatibility; micro arrays; microelectronic fabrication technology; optical fluorescence; optical labels; silicon based material; silicon compatible material surface; silicon compatible materials; silicon dioxide surface; silicon wafers; surface conditions; surface treatment; Atom optics; Atomic force microscopy; DNA; Microelectronics; Optical device fabrication; Optical materials; Probes; Silicon compounds; Stimulated emission; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6714-6
Type :
conf
DOI :
10.1109/HKEDM.2001.946918
Filename :
946918
Link To Document :
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