Ensuring system reliability: From FET characterization to performance prediction

Summary form only given. Transistor level temporal degradation is becoming a big reliability concern for systems in the field. These vulnerable systems range from ASICs in mobile devices to high-performance enterprise servers. To ensure reliable operation of these systems, we need to characterize device aging, predict its impact on system performance and build smart systems to adapt their functionality to device aging. In this presentation, we´ll discuss the key ingredients of device models and tools for aging prediction due to BTI, HCI and TDDB. We´ll also discuss the recent approaches for in-field adaptation of a system to its aging devices.