• DocumentCode
    3434615
  • Title

    Taming the coupling effects during the design of multilayered substrates

  • Author

    Charruau, S. ; Misson, H. ; Touboul, A.

  • Author_Institution
    Sextant Avionique, St. Medard en Jalles, France
  • fYear
    1995
  • fDate
    4-6 Dec 1995
  • Firstpage
    453
  • Lastpage
    455
  • Abstract
    This paper presents a novel approach for an electrical simulation tool to control the signal integrity in the bulk of any multilayered substrate when routing process is carried on a CAD workstation to achieve building-in quality and reliability for high density interconnections. These innovative features are found in the topological approach of the whole set of interconnections subject to electromagnetic interferences in the substrate such as a PCB. The lossy transmission line equations are solved in the time-domain using wavelets-like functions, which leads to save CPU-time and memory space when compared to the classical Fourier transform. This software is merged into a PCB-CAD workstation to offer the capability of performing in real time a crosstalk-free design
  • Keywords
    circuit CAD; crosstalk; electromagnetic interference; printed circuit design; substrates; time-domain analysis; transmission line theory; wavelet transforms; PCB-CAD software; coupling effect; crosstalk; design; electrical simulation; electromagnetic interference; high density interconnections; lossy transmission line; multilayered substrate; routing; signal integrity; time-domain analysis; topology; wavelets-like function; Design automation; Electromagnetic interference; Equations; Fourier transforms; Propagation losses; Routing; Signal processing; Time domain analysis; Transmission lines; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
  • Conference_Location
    Omiya
  • Print_ISBN
    0-7803-3622-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.541084
  • Filename
    541084