A fault-tolerant multi-port associative memory scheme

Author

Dadda, L. ; Sami, M.G. ; Stefanelli, Riccardo

Author_Institution

Dipartimento di Elettronica, Politecnico di Milano, Italy

fYear

1993

fDate

1993

Firstpage

75

Lastpage

84

Abstract

A multiport associative memory allowing independent and simultaneous access from the two ports is described. The device is conceived as part of a complex digital system designed for calorimetry at CERN´s large Hadron Collider, so that system requirements dictate functional specification of the memory. Ad hoc fault tolerance policies, supporting both permanent and transient fault treatment, are introduced to account for the severe environment in which the system will operate.

Keywords

calorimetry; content-addressable storage; nuclear electronics; particle detectors; proton accelerators; storage rings; synchrotrons; CERN large Hadron Collider; calorimetry; digital system; fault-tolerant multi-port associative memory scheme; functional specification; permanent fault treatment; system requirements; transient fault treatment; Associative memory; Calorimetry; Colliding beam devices; Digital systems; Fault tolerance; Fault tolerant systems; Frequency; Large Hadron Collider; Particle beams; Pulse generation;

fLanguage

English

Publisher

ieee

Conference_Titel

Wafer Scale Integration, 1993. Proceedings., Fifth Annual IEEE International Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-0867-0

Type

conf

DOI

10.1109/ICWSI.1993.255271

Filename

255271