DocumentCode :
3434707
Title :
An AFM study on the degradation of phase-change recordable compact disc
Author :
Ng, W.M.C. ; Ho, H.P.
Author_Institution :
Dept. of Phys. & Mater. Sci., City Univ. of Hong Kong, Kowloon, China
fYear :
2001
fDate :
2001
Firstpage :
116
Lastpage :
121
Abstract :
An AFM study on the degradation in phase-change recordable compact discs is presented. The results indicate that degradation is primarily due to the formation of bubbles within the phase-change layer, which may act as light scattering centers. Doping of nitrogen in the dielectric layers or using higher track speed can slow down the formation of bubbles. We also present a new technique for enhancing the topological contrast of the phase change marks by electroplating the phase-change layer with nickel
Keywords :
atomic force microscopy; audio discs; bubbles; doping profiles; electroplating; light scattering; optical disc storage; reliability; surface topography; AFM; CD degradation; Ni; Ni electroplating; bubble formation; dielectric layers; light scattering centers; nitrogen doping; phase change marks; phase-change layer; phase-change recordable compact disc; topological contrast; track speed; Amorphous materials; Atomic force microscopy; Conductivity; Crystallization; Degradation; Performance evaluation; Scanning electron microscopy; Surface topography; Testing; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6714-6
Type :
conf
DOI :
10.1109/HKEDM.2001.946931
Filename :
946931
Link To Document :
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