DocumentCode :
3434798
Title :
Characterization of GaN thin films on HVPE GaN templates
Author :
Zhu, C.F. ; Fong, W.K. ; Leung, B.H. ; Chan, N.H. ; Surya, C.
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., China
fYear :
2001
fDate :
2001
Firstpage :
140
Lastpage :
143
Abstract :
Homoepitaxial growth of GaN thin films by RF plasma-assisted MBE on HVPE templates is examined in detail. Two different growth techniques are investigated. In one group of samples, the high-temperature GaN epitaxial layers were grown directly on HVPE-grown GaN/sapphire composite substrates. In another group of samples, intermediate temperature buffer layers (ITBLs) of 800 nm thick were first deposited on top of the HVPE GaN templates by MBE before the growth of high-temperature epitaxial GaN layers. Substantial improvements in both the photoluminescence and the Hall mobility are observed for samples grown with the use of ITBLs
Keywords :
Hall mobility; III-V semiconductors; gallium compounds; interface structure; molecular beam epitaxial growth; photoluminescence; plasma materials processing; semiconductor growth; wide band gap semiconductors; 800 nm; GaN; GaN thin films; GaN-Al2O3; HVPE GaN templates; HVPE templates; HVPE-grown GaN/sapphire composite substrates; Hall mobility; ITBLs; MBE; RF plasma-assisted MBE; growth techniques; high-temperature GaN epitaxial layers; high-temperature epitaxial GaN layers; homoepitaxial growth; intermediate temperature buffer layers; photoluminescence; Buffer layers; Epitaxial layers; Gallium nitride; Hall effect; Molecular beam epitaxial growth; Photoluminescence; Plasma temperature; Radio frequency; Substrates; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6714-6
Type :
conf
DOI :
10.1109/HKEDM.2001.946935
Filename :
946935
Link To Document :
بازگشت