DocumentCode
3434798
Title
Characterization of GaN thin films on HVPE GaN templates
Author
Zhu, C.F. ; Fong, W.K. ; Leung, B.H. ; Chan, N.H. ; Surya, C.
Author_Institution
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., China
fYear
2001
fDate
2001
Firstpage
140
Lastpage
143
Abstract
Homoepitaxial growth of GaN thin films by RF plasma-assisted MBE on HVPE templates is examined in detail. Two different growth techniques are investigated. In one group of samples, the high-temperature GaN epitaxial layers were grown directly on HVPE-grown GaN/sapphire composite substrates. In another group of samples, intermediate temperature buffer layers (ITBLs) of 800 nm thick were first deposited on top of the HVPE GaN templates by MBE before the growth of high-temperature epitaxial GaN layers. Substantial improvements in both the photoluminescence and the Hall mobility are observed for samples grown with the use of ITBLs
Keywords
Hall mobility; III-V semiconductors; gallium compounds; interface structure; molecular beam epitaxial growth; photoluminescence; plasma materials processing; semiconductor growth; wide band gap semiconductors; 800 nm; GaN; GaN thin films; GaN-Al2O3; HVPE GaN templates; HVPE templates; HVPE-grown GaN/sapphire composite substrates; Hall mobility; ITBLs; MBE; RF plasma-assisted MBE; growth techniques; high-temperature GaN epitaxial layers; high-temperature epitaxial GaN layers; homoepitaxial growth; intermediate temperature buffer layers; photoluminescence; Buffer layers; Epitaxial layers; Gallium nitride; Hall effect; Molecular beam epitaxial growth; Photoluminescence; Plasma temperature; Radio frequency; Substrates; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location
Hong Kong
Print_ISBN
0-7803-6714-6
Type
conf
DOI
10.1109/HKEDM.2001.946935
Filename
946935
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