DocumentCode
3435185
Title
Random benchmark circuits with controlled attributes
Author
Iwama, Kazuo ; Hino, Keiisuke ; Kurokawa, Hiroyuki ; Sawada, Sunao
Author_Institution
Dept. of Comput. Sci. & Commun. Eng., Kyushu Univ., Fukuoka, Japan
fYear
1997
fDate
17-20 Mar 1997
Firstpage
90
Lastpage
97
Abstract
Two major improvements, controlled fan-in and automated initial-circuit production, were made over the random generator of benchmark circuits presented at DAC´94. This is an important progress towards our goal of random benchmarking: more general and secure testing, increasing the naturality of random circuits by controlling their attributes, and obtaining test results by which the difference of performances under evaluation can be made clear
Keywords
NAND circuits; circuit analysis computing; logic CAD; logic testing; random processes; automated initial-circuit production; controlled attributes; controlled fan-in; random benchmark circuits; random generator; testing; Benchmark testing; Circuit testing; Communication system control; Control systems; Instruments; Logic circuits; Logic functions; Logic testing; Performance evaluation; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location
Paris
ISSN
1066-1409
Print_ISBN
0-8186-7786-4
Type
conf
DOI
10.1109/EDTC.1997.582338
Filename
582338
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