Title :
Random benchmark circuits with controlled attributes
Author :
Iwama, Kazuo ; Hino, Keiisuke ; Kurokawa, Hiroyuki ; Sawada, Sunao
Author_Institution :
Dept. of Comput. Sci. & Commun. Eng., Kyushu Univ., Fukuoka, Japan
Abstract :
Two major improvements, controlled fan-in and automated initial-circuit production, were made over the random generator of benchmark circuits presented at DAC´94. This is an important progress towards our goal of random benchmarking: more general and secure testing, increasing the naturality of random circuits by controlling their attributes, and obtaining test results by which the difference of performances under evaluation can be made clear
Keywords :
NAND circuits; circuit analysis computing; logic CAD; logic testing; random processes; automated initial-circuit production; controlled attributes; controlled fan-in; random benchmark circuits; random generator; testing; Benchmark testing; Circuit testing; Communication system control; Control systems; Instruments; Logic circuits; Logic functions; Logic testing; Performance evaluation; System testing;
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7786-4
DOI :
10.1109/EDTC.1997.582338
