DocumentCode
3435212
Title
Application of the thermal network method to the transient thermal analysis of multichip modules
Author
Ishizuka, Masaru ; Hisano, Katsumi ; Sasaki, Tomiya ; Fukuoka, Yoshitaka
Author_Institution
Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan
fYear
1995
fDate
4-6 Dec 1995
Firstpage
464
Lastpage
467
Abstract
In recent years, there has been a growing demand to have smaller and lighter electronic circuits with greater complexity, multifunctionality and reliability. High-density multichip packaging technology has been used to meet these requirements. The higher the density scale is, the larger the power dissipation per unit area becomes. Therefore, in thermal design process it has become very important to carry out the thermal analysis. However, the heat transport model in multichip modules is complex and its treatment is tedious and time consuming. This paper describes an application of the thermal network method to the transient thermal analysis of multichip modules and proposes a simple model for the thermal analysis of multichip modules as a preliminary thermal design tool
Keywords
heat conduction; heat radiation; integrated circuit design; integrated circuit reliability; multichip modules; natural convection; thermal analysis; transient analysis; multichip modules; power dissipation; reliability; thermal design process; thermal network method; transient thermal analysis; Circuits; Conductivity measurement; Electronic packaging thermal management; Multichip modules; Power dissipation; Power measurement; Power transistors; Space technology; Temperature distribution; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
Conference_Location
Omiya
Print_ISBN
0-7803-3622-4
Type
conf
DOI
10.1109/IEMT.1995.541087
Filename
541087
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