DocumentCode :
3435353
Title :
Compact Mobile RFID Antenna Design and Analysis Using Photonic-assisted Vector Near-field Characterization
Author :
Kang, Jeong-Jin ; Lee, Dong-Joon ; Chen, Chia-Chu ; Whitaker, John F. ; Rothwell, Edward J.
Author_Institution :
Dept. of Inf. & Commun., Dong Seoul Coll., Seongnam
fYear :
2008
fDate :
16-17 April 2008
Firstpage :
81
Lastpage :
88
Abstract :
We present the design and analysis of a small planar loop antenna for applications in mobile RFID readers within the cell phone band. Compactness of the loop antenna, crucial to size reduction in antennas designed for mobile handsets, is realized by bending a folded-dipole in a circular fashion. Furthermore, capacitive loading, through a parasitic patch, is created inside the loop antenna and has an effect of increasing the electrical length of the structure. This enhanced length provides tunability of the resonance frequencies and a secondary dominant radiation port in the center of the antenna. A short planar dipole is transformed to a twice folded dipole and a loop antenna to produce a larger input resistance. We also analyze the performance of the RFID antenna by exploring the current-induced near field radiation patterns using a non-invasive photonic- assisted dielectric field mapping system. The evolution from the near to the far field is also discussed.
Keywords :
antenna radiation patterns; cellular radio; dipole antennas; loop antennas; microstrip antennas; mobile antennas; planar antennas; radiofrequency identification; cell phone band; compact mobile RFID antenna design; current-induced near field radiation pattern; dielectric field mapping; folded-dipole antenna; mobile handset; parasitic patch antenna; photonic-assisted vector near-field characterization; planar loop antenna; Cellular phones; Dipole antennas; Electric resistance; Loaded antennas; Mobile antennas; Mobile handsets; Pattern analysis; Radiofrequency identification; Resonance; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
RFID, 2008 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-1711-7
Electronic_ISBN :
978-1-4244-1712-4
Type :
conf
DOI :
10.1109/RFID.2008.4519367
Filename :
4519367
Link To Document :
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