DocumentCode :
3435583
Title :
Fault estimation and virtual sensor FTC approach for LPV systems
Author :
De Oca, Saúl Montes ; Rotondo, Damiano ; Nejjari, Fatiha ; Puig, Vicenç
Author_Institution :
Dept. of Tech., Univ. of Catalonia (UPC), Barcelona, Spain
fYear :
2011
fDate :
12-15 Dec. 2011
Firstpage :
2251
Lastpage :
2256
Abstract :
In this paper, a Fault Tolerant Control (FTC) strategy using a virtual sensor for Linear Parameter Varying (LPV) systems is proposed. The main idea of this FTC method is to reconfigure the control loop such that the nominal controller could still be used without need of retuning it. The plant with the faulty sensor is modified adding the virtual sensor block that masks the sensor fault. The suggested strategy is an active FTC strategy that reconfigures the virtual sensor on-line taking into account faults and operating point changes. In order to implement the virtual sensor approach, a fault estimation is required. Here, this fault estimation is provided by formulating it as a parameter estimation problem. Then, a block/batch least square approach is used to estimate additive and multiplicative faults. The LPV virtual sensor is designed using polytopic LPV techniques and Linear Matrix Inequalities (LMIs). To assess the performance of the proposed approach a two degree of freedom helicopter simulator is used.
Keywords :
fault tolerance; linear matrix inequalities; linear systems; parameter estimation; stability; LPV systems; additive fault; block/batch least square approach; control loop; fault estimation; fault tolerant control; linear matrix inequalities; linear parameter varying systems; multiplicative fault; parameter estimation; polytopic LPV techniques; virtual sensor FTC approach; Approximation methods; Mathematical model; Observers; Rotors; Transmission line measurements; Vectors; Fault Tolerant Control; Linear Matrix Inequality; Linear Parameter Varying; TRMS; Virtual Sensor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control and European Control Conference (CDC-ECC), 2011 50th IEEE Conference on
Conference_Location :
Orlando, FL
ISSN :
0743-1546
Print_ISBN :
978-1-61284-800-6
Electronic_ISBN :
0743-1546
Type :
conf
DOI :
10.1109/CDC.2011.6160934
Filename :
6160934
Link To Document :
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