• DocumentCode
    3435589
  • Title

    Connection error location and correction in combinational circuits

  • Author

    Wahba, Ayman M. ; Borrione, Dominique

  • Author_Institution
    TIMA Lab., Modelisation et Verification des Syst. Digitaux, Grenoble, France
  • fYear
    1997
  • fDate
    17-20 Mar 1997
  • Firstpage
    235
  • Lastpage
    241
  • Abstract
    We present new diagnostic algorithms for localizing connection errors in combinational circuits. Three types of errors are considered: extra, missing, and bad connection errors. Special test patterns are generated to rapidly locate the error. The algorithms are integrated within the PrevailTM system. Results on benchmarks show that the error is always located within a time proportional to the product of the circuit size, and the number of used patterns
  • Keywords
    combinational circuits; errors; fault diagnosis; fault location; logic testing; Prevail system; combinational circuit; connection error correction; connection error location; diagnostic algorithm; test pattern generation; Circuit simulation; Circuit testing; Combinational circuits; Counting circuits; Error correction; Fault diagnosis; Inverters; Laboratories; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1997. ED&TC 97. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1066-1409
  • Print_ISBN
    0-8186-7786-4
  • Type

    conf

  • DOI
    10.1109/EDTC.1997.582365
  • Filename
    582365
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3435589