DocumentCode :
3435616
Title :
Keynote Address
Author :
Fields, J.
Author_Institution :
Agere Systems
fYear :
2003
fDate :
27 April-1 May 2003
Firstpage :
3
Lastpage :
3
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
ISSN :
1093-0167
Print_ISBN :
0-7695-1924-5
Type :
conf
DOI :
10.1109/VTEST.2003.1197623
Filename :
1197623
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3435616
