DocumentCode

3435616

Title

Keynote Address

Author

Fields, J.

Author_Institution

Agere Systems

fYear

2003

fDate

27 April-1 May 2003

Firstpage

3

Lastpage

3

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2003. Proceedings. 21st

ISSN

1093-0167

Print_ISBN

0-7695-1924-5

Type

conf

DOI

10.1109/VTEST.2003.1197623

Filename

1197623