Title :
Building yield into systems-on chips for nanometer technologies
Author :
Magarshack, Philippe
Author_Institution :
STMicroelectronics
fDate :
27 April-1 May 2003
Keywords :
System testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
Print_ISBN :
0-7695-1924-5
DOI :
10.1109/VTEST.2003.1197624
