A production-oriented measurement method for fast and exhaustive Iddq tests

Author

Laquai, B. ; Richter, H. ; Werkmann, H.

Author_Institution

IMS, Stuttgart, Germany

fYear

1997

fDate

17-20 Mar 1997

Firstpage

279

Lastpage

286

Abstract

The paper describes a measurement method to perform an iddq test on each vector of a test pattern. The measurement is performed using the functional test mode of a digital tester. Vector rates between 100 KHz and 10 MHz yield a current resolution of 10 uA to 100 uA. The great advantage of the method is that the measurements are performed by using only the tester´s pin electronic and the existing control software. No additional equipment is neccessary and the setup of the loadboard is made without any additional components except a buffering capacitance for the device, if needed. The application of the method to the iddq test of an 8 bit microcontroller is described

Keywords

electric current measurement; integrated circuit testing; microcontrollers; 10 to 100 muA; 100 kHz to 10 MHz; 8 bit; IDDQ testing; buffering capacitance; control software; digital tester; measurement method; microcontroller; pin electronics; Circuit testing; Current measurement; Driver circuits; Electronic equipment testing; FETs; Leakage current; Performance evaluation; Power measurement; Velocity measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1997. ED&TC 97. Proceedings

Conference_Location

Paris

ISSN

1066-1409

Print_ISBN

0-8186-7786-4

Type

conf

DOI

10.1109/EDTC.1997.582371

Filename

582371