DocumentCode :
3435696
Title :
VTS´02 Best Paper Award
fYear :
2003
fDate :
1-1 May 2003
Firstpage :
6
Lastpage :
6
Abstract :
The award winners and the titles of their award winning papers are listed.
Keywords :
Awards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
Conference_Location :
Napa, CA, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-1924-5
Type :
conf
DOI :
10.1109/VTEST.2003.1197626
Filename :
1197626
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3435696
