Title :
The future of semiconductors; Moore or less
Author :
Veendrick, Harry
Abstract :
Scaling results in: increasing design productivity gap; increasing mask costs; increasing leakage currents; increasing noise while noise margins reduce; increasing test costs; increasing technology costs due to approaching the limits. Design measures to limit leakage and noise and to support testing and debug, require an increasing number of transistors (up to 20-40%) and more complex processes to support embedded options. The move to the next technology will become less and less commercially attractive
Keywords :
integrated circuit design; integrated circuit noise; integrated circuit testing; leakage currents; masks; technological forecasting; debug; design productivity gap; embedded options; leakage currents; mask costs; noise margins; scaling; test costs; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2001. Tutorial Guide: ISCAS 2001. The IEEE International Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
0-7803-7113-5
DOI :
10.1109/TUTCAS.2001.946983
