Title :
Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs
Author :
Benware, B.R. ; Madge, R. ; Lu, C. ; Daasch, R.
fDate :
27 April-1 May 2003
Abstract :
In sub-micron processes, resistive path defects are increasingly contributing to the yield loss and the customer fail pareto. Data has been collected on a series of ASIC products and it has been used to compare the effectiveness of full vector set transition delay fault tests with reduced vector sets, minVDD, customer functional tests and customers system fails. Results show that fault models do not predict the defect coverage well and cost effective screening of frequency outliers and minVDD outliers is possible and is critical in improving customer quality.
Keywords :
application specific integrated circuits; failure analysis; fault location; integrated circuit reliability; integrated circuit testing; integrated circuit yield; quality control; complex ASIC; cost effective screening; customer quality; customer system failures; defect coverage; fault models; frequency outliers; full vector set transition delay fault tests; functional tests; minVDD outliers; outlier screening methods; reduced vector sets; resistive path defects; screening method effectiveness; yield loss; Application specific integrated circuits; Costs; Delay; Frequency dependence; Large scale integration; Logic design; Logic testing; Production; System testing; Timing;
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
Print_ISBN :
0-7695-1924-5
DOI :
10.1109/VTEST.2003.1197631
