Title :
High speed ring generators and compactors of test data [logic IC test]
Author :
Mrugalski, Grzegorz ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Poznan Univ. of Technol., Poland
fDate :
27 April-1 May 2003
Abstract :
This paper presents a new highly modular architecture of generators and compactors of test patterns. This structure has fewer levels of logic, smaller fan-out, reduced area, and operates at faster speed than external feedback LFSRs, internal feedback LFSRs, and cellular automata, all implementing the same characteristic polynomial.
Keywords :
finite state machines; integrated circuit testing; logic design; logic testing; shift registers; cellular automata; external feedback LFSR; fan-out; high speed ring generators; internal feedback LFSR; logic IC test; logic levels; modular architecture; optimized linear finite state machine; polynomial implementation; test data compactors; test pattern generators; Automata; Automatic testing; Feedback; Flip-flops; Graphics; Integrated circuit interconnections; Logic; Polynomials; Ring generators; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
Print_ISBN :
0-7695-1924-5
DOI :
10.1109/VTEST.2003.1197633
