DocumentCode
3435813
Title
High speed ring generators and compactors of test data [logic IC test]
Author
Mrugalski, Grzegorz ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution
Poznan Univ. of Technol., Poland
fYear
2003
fDate
27 April-1 May 2003
Firstpage
57
Lastpage
62
Abstract
This paper presents a new highly modular architecture of generators and compactors of test patterns. This structure has fewer levels of logic, smaller fan-out, reduced area, and operates at faster speed than external feedback LFSRs, internal feedback LFSRs, and cellular automata, all implementing the same characteristic polynomial.
Keywords
finite state machines; integrated circuit testing; logic design; logic testing; shift registers; cellular automata; external feedback LFSR; fan-out; high speed ring generators; internal feedback LFSR; logic IC test; logic levels; modular architecture; optimized linear finite state machine; polynomial implementation; test data compactors; test pattern generators; Automata; Automatic testing; Feedback; Flip-flops; Graphics; Integrated circuit interconnections; Logic; Polynomials; Ring generators; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2003. Proceedings. 21st
ISSN
1093-0167
Print_ISBN
0-7695-1924-5
Type
conf
DOI
10.1109/VTEST.2003.1197633
Filename
1197633
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