Title :
DG summary: Resistive memories
Author :
Ramaswamy, Nirmal ; Wu, Yi
Author_Institution :
Micron
Abstract :
The DG on resistive memories took place on the evening of Oct. 16, 2012, with approximately fourteen attendees. Various aspects of RRAM were discussed.
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
Conference_Location :
South Lake Tahoe, CA, USA
Print_ISBN :
978-1-4673-2749-7
DOI :
10.1109/IIRW.2012.6468965
