Title :
DG summary: BEOL discussion
Author :
Lloyd, James ; McGowan, Brian
Author_Institution :
SUNY Albany CNSE
Abstract :
The DG on back-end of the line reliability took place on the evening of Oct. 17, 2012, with attendees ready to discuss challenges in the BEOL field.
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
Conference_Location :
South Lake Tahoe, CA, USA
Print_ISBN :
978-1-4673-2749-7
DOI :
10.1109/IIRW.2012.6468966
