DocumentCode :
3435876
Title :
Ultra low cost analog BIST using spectral analysis
Author :
Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro Amadeu
Author_Institution :
Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
fYear :
2003
fDate :
27 April-1 May 2003
Firstpage :
77
Lastpage :
82
Abstract :
In this work, a low cost method to implement an analog BIST scheme for the system on chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practical results illustrating limitations and advantages of the proposed technique.
Keywords :
analogue-digital conversion; built-in self test; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; spectral analysis; system-on-chip; 1 bit; SOC; analog circuit partitioning; analog information capture; analog test; digital-based spectral analysis; single bit digitizer; system on chip; ultra low cost analog BIST; Analog circuits; Autocorrelation; Built-in self-test; Circuit noise; Circuit testing; Costs; Digital signal processing; Frequency; Spectral analysis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
ISSN :
1093-0167
Print_ISBN :
0-7695-1924-5
Type :
conf
DOI :
10.1109/VTEST.2003.1197636
Filename :
1197636
Link To Document :
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