Reconfigurable data converter as a building block for mixed-signal test

Author

Lee, Edward K F

Author_Institution

Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA

fYear

1997

fDate

17-20 Mar 1997

Firstpage

359

Lastpage

363

Abstract

A reconfigurable data converter (RDC) that can be configured to a number of ADCs and DACs having different speeds and resolutions for testing mixed-signal systems is proposed. It can be used as a building block in mixed-signal boundary scan or built-in self-test (BIST) techniques. The RDC can also be configured as random noise generators and used as test stimuli in BIST. Since the required area of the proposed RDC is only slightly larger than that of a conventional pipelined ADC, it can be used in many mixed-signal systems

Keywords

boundary scan testing; built-in self test; data conversion; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; noise generators; ADC; BIST techniques; DAC; boundary scan technique; building block; built-in self-test; mixed-signal test; random noise generators; reconfigurable data converter; test stimuli application; Automatic testing; Built-in self-test; Cascading style sheets; Circuit testing; Data engineering; Design for testability; Multiprocessor interconnection networks; Noise generators; System testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1997. ED&TC 97. Proceedings

Conference_Location

Paris

ISSN

1066-1409

Print_ISBN

0-8186-7786-4

Type

conf

DOI

10.1109/EDTC.1997.582383

Filename

582383