DocumentCode :
3435889
Title :
Reconfigurable data converter as a building block for mixed-signal test
Author :
Lee, Edward K F
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear :
1997
fDate :
17-20 Mar 1997
Firstpage :
359
Lastpage :
363
Abstract :
A reconfigurable data converter (RDC) that can be configured to a number of ADCs and DACs having different speeds and resolutions for testing mixed-signal systems is proposed. It can be used as a building block in mixed-signal boundary scan or built-in self-test (BIST) techniques. The RDC can also be configured as random noise generators and used as test stimuli in BIST. Since the required area of the proposed RDC is only slightly larger than that of a conventional pipelined ADC, it can be used in many mixed-signal systems
Keywords :
boundary scan testing; built-in self test; data conversion; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; noise generators; ADC; BIST techniques; DAC; boundary scan technique; building block; built-in self-test; mixed-signal test; random noise generators; reconfigurable data converter; test stimuli application; Automatic testing; Built-in self-test; Cascading style sheets; Circuit testing; Data engineering; Design for testability; Multiprocessor interconnection networks; Noise generators; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
ISSN :
1066-1409
Print_ISBN :
0-8186-7786-4
Type :
conf
DOI :
10.1109/EDTC.1997.582383
Filename :
582383
Link To Document :
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