• DocumentCode
    3435891
  • Title

    DG summary: Product/circuit reliability discussion

  • Author

    Bansal, Aditya ; Wu, James

  • Author_Institution
    IBM
  • fYear
    2012
  • fDate
    14-18 Oct. 2012
  • Firstpage
    224
  • Lastpage
    224
  • Abstract
    The DG on product/circuit reliability took place on the evening of Oct. 17, 2012. The moderator welcomed about twenty or so attendees to share their thoughts and experiences relevant to this topic.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
  • Conference_Location
    South Lake Tahoe, CA, USA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4673-2749-7
  • Type

    conf

  • DOI
    10.1109/IIRW.2012.6468968
  • Filename
    6468968
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3435891