DocumentCode
3436075
Title
Notice of Retraction
Bayesian credible limits of the reliability and its applications
Author
Ming Han
Author_Institution
Sch. of Sci., Ningbo Univ. of Technol., Ningbo, China
fYear
2013
fDate
15-18 July 2013
Firstpage
303
Lastpage
307
Abstract
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
This article to the reliability derived from binomial distribution, in the case data with only one failure, one-sided and two-sided Bayesian credible limits are discussed. Firstly, formulas of the one-sided and two-sided Bayesian credible limits are provided. Secondly, formulas of the one-sided and two-sided classical confidence limits are also provided. Finally, the numerical example is provided for illustrative purpose.
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
This article to the reliability derived from binomial distribution, in the case data with only one failure, one-sided and two-sided Bayesian credible limits are discussed. Firstly, formulas of the one-sided and two-sided Bayesian credible limits are provided. Secondly, formulas of the one-sided and two-sided classical confidence limits are also provided. Finally, the numerical example is provided for illustrative purpose.
Keywords
Bayes methods; binomial distribution; reliability; binomial distribution; one-sided Bayesian credible limit; one-sided classical confidence limit; reliability limit; two-sided Bayesian credible limit; two-sided classical confidence limit; Bayes methods; Density functional theory; Equations; Integrated circuits; Mathematical model; Reliability engineering; Bayesian credible limit; Binomial distribution; classical confidence limit; data with only one failure; reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-1014-4
Type
conf
DOI
10.1109/QR2MSE.2013.6625589
Filename
6625589
Link To Document