Title :
1149.4 based on-line quiescent state monitoring technique [analog DFT]
Author :
Su, Chauchin ; Wang, Chih-Hu ; Wang, Wei-Juo ; Tseng, IS
Author_Institution :
Dept. of Electr. & Comput. Eng., CE, Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
27 April-1 May 2003
Abstract :
On-line quiescent state monitoring is achieved by utilizing dual comparators compatible with the IEEE 1149.4 standard analog DFT. Statistical analysis is used to minimize the impacts of dynamic signals and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure the test methodology.
Keywords :
IEEE standards; analogue integrated circuits; comparators (circuits); condition monitoring; design for testability; integrated circuit design; integrated circuit testing; statistical analysis; IEEE 1149.4 standard; analog DFT; dual comparators; dynamic signals; on-line quiescent state monitoring; signal line noise; statistical analysis; Circuit testing; Data communication; Digital signal processing; Mathematical analysis; Monitoring; Operational amplifiers; Radio frequency; Signal processing; Statistical analysis; System performance;
Conference_Titel :
VLSI Test Symposium, 2003. Proceedings. 21st
Print_ISBN :
0-7695-1924-5
DOI :
10.1109/VTEST.2003.1197651
