Title :
Molecular beam epitaxial growth of group III-nitride-arsenides for long wavelength optoelectronics
Author :
Spruytte, S.G. ; Larson, M.C. ; Wampler, W. ; Coldren, C.W. ; Harris, J.S.
Author_Institution :
Solid State Lab., Stanford Univ., CA, USA
Abstract :
Nitride-arsenides are promising materials for long wavelength opto-electronic devices grown on GaAs substrates. The photoluminescence intensity of GaNAs and GaInNAs quantum wells increases drastically and shifts to shorter wavelengths following high temperature anneal. A study of PL after different annealing conditions revealed that the wavelength shift and the intensity increase occur together. We observe a decrease of interstitial nitrogen after annealing, probably resulting in the increased luminescence efficiency. Nitrogen diffusion out of the QWs is responsible for the wavelength shift. To limit nitrogen diffusion, the GaAs barriers surrounding the GaInNAs QWs were replaced by GaNAs barriers. This new active region resulted in devices emitting at 1.3 μm
Keywords :
III-V semiconductors; annealing; gallium arsenide; gallium compounds; indium compounds; interstitials; molecular beam epitaxial growth; photoluminescence; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum wells; spectral line intensity; spectral line shift; wide band gap semiconductors; 1.3 mum; GaAs; GaAs barriers; GaAs substrates; GaInNAs; GaInNAs QWs; GaNAs; GaNAs barriers; PL; active region; annealing conditions; group III-nitride-arsenides; high temperature anneal; intensity increase; interstitial nitrogen; long wavelength optoelectronics; luminescence efficiency; molecular beam epitaxial growth; nitrogen diffusion; photoluminescence intensity; quantum wells; wavelength shift; Annealing; Gain measurement; Gallium arsenide; Impurities; Laboratories; Luminescence; Molecular beam epitaxial growth; Nitrogen; Optoelectronic devices; Photoluminescence;
Conference_Titel :
Compound Semiconductors, 2000 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-6258-6
DOI :
10.1109/ISCS.2000.947129