Title :
A fault diagnosis methodology for the UltraSPARCTM-I microprocessor
Author :
Narayanan, Sridhar ; Srinivasan, Rajagopalan ; Kunda, Ramachandra P. ; Levitt, Marc E. ; Bozorgui-nesbat, Saied
Author_Institution :
Sun Microsyst. Inc., Mountain View, CA, USA
Abstract :
In this paper we study the use of precomputed fault dictionaries to diagnose stuck-at and bridging defects in the UltraSPARCTM-I processor. In constructing the dictionary we analyze the effect of the dictionary format on parameters such as memory size, computational effort, and diagnostic resolution. The dictionary is built based on modeled stuck-at faults. However to effectively diagnose both stuck-at and bridging faults, we employ a novel procedure that combines dictionary information with potential bridge defects extracted from layout. Experiments with failing devices show excellent correlation of predicted errors with actual defects
Keywords :
computer testing; failure analysis; fault diagnosis; integrated circuit testing; logic testing; microprocessor chips; UltraSPARC-I microprocessor; bridging defects; computational effort; diagnostic resolution; failure mechanisms; fault diagnosis methodology; layout; memory size; precomputed fault dictionaries; predicted errors; stuck-at defects; CMOS technology; Circuit faults; Computational modeling; Design methodology; Dictionaries; Failure analysis; Fault diagnosis; Microprocessors; Sun; Testing;
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7786-4
DOI :
10.1109/EDTC.1997.582406
