Reliability research for PV system using BDD-based fault tree analysis

Author

Rong Hu ; Jinhua Mi ; Tianyou Hu ; Minling Fu ; Pan Yang

Author_Institution

Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

fYear

2013

fDate

15-18 July 2013

Firstpage

359

Lastpage

363

Abstract

This paper mainly takes the photovoltaic system as the study object, analyze the performance and reliability of this system. Firstly, fault tree analysis method is introduced which aims at acquiring the top event probability of system failure. Secondly, the method of binary decision diagram is used to analyze the reliability of this system qualitatively and quantitatively. By sorting the basic events, the fault tree of photovoltaic system is established. The probability of failure for top event is calculated quantitatively based on qualitative analysis results, which can provide theoretical basis for the weak link of the system.

Keywords

binary decision diagrams; fault trees; photovoltaic power systems; power generation reliability; probability; BDD-based fault tree analysis; binary decision diagram; photovoltaic power systems; reliability research; system failure; top event probability; Boolean functions; Data structures; Fault trees; Inverters; Photovoltaic systems; Power system reliability; Reliability; binary decision diagram; fault tree; photovoltaic; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4799-1014-4

Type

conf

DOI

10.1109/QR2MSE.2013.6625601

Filename

6625601