DocumentCode
3436507
Title
Notice of Retraction
Bayesian reliability estimation of electronic components with zero-failure data
Author
Ze Cheng ; Zhaolong Xuan ; Wei Wang ; Tieshan Zhao
Author_Institution
Ammunition Eng. Dept., Ordnance Eng. Coll., Shijiazhuang, China
fYear
2013
fDate
15-18 July 2013
Firstpage
399
Lastpage
401
Abstract
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Due to the test costs and test organization, it is difficult to make a large number of tests, the precision of assessment can be improved by using unit information when estimating the reliability of electronic components. When the data are zero-failure, the precision can be improved obviously by using Bayes method with reducing the number of samplings. This paper presents that during the process of test, the accuracy of the quality assessment for electronic devices can be improved by using Bayes method with full use of prior information.
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Due to the test costs and test organization, it is difficult to make a large number of tests, the precision of assessment can be improved by using unit information when estimating the reliability of electronic components. When the data are zero-failure, the precision can be improved obviously by using Bayes method with reducing the number of samplings. This paper presents that during the process of test, the accuracy of the quality assessment for electronic devices can be improved by using Bayes method with full use of prior information.
Keywords
Bayes methods; electronic equipment testing; reliability; Bayes method; Bayesian reliability estimation; assessment precision; electronic components; quality assessment; unit information; zero-failure data; Accuracy; Bayes methods; Electronic components; Estimation; Organizations; Reliability engineering; Bayesian method; electronic components; prior distribution; zero-failure;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-1014-4
Type
conf
DOI
10.1109/QR2MSE.2013.6625611
Filename
6625611
Link To Document