Title :
A new quality estimation methodology for mixed-signal and analogue ICs
Author :
Olbrich, T. ; Grout, I.A. ; Aimine, Y. Eben ; Richardson, A.M. ; Contensou, J.
Author_Institution :
Austria Mikro Syst. Int. AG, Unterpremstatten, Austria
Abstract :
IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program
Keywords :
analogue integrated circuits; integrated circuit manufacture; mixed analogue-digital integrated circuits; production testing; quality control; IC product quality; analogue ICs; inductive fault analysis; manufacturing test program; mixed-signal ICs; quality estimation methodology; quality related parameters; Analog integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Circuits and systems; Integrated circuit modeling; Integrated circuit testing; Production; System testing; Virtual manufacturing;
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7786-4
DOI :
10.1109/EDTC.1997.582419
