DocumentCode
3436566
Title
A new quality estimation methodology for mixed-signal and analogue ICs
Author
Olbrich, T. ; Grout, I.A. ; Aimine, Y. Eben ; Richardson, A.M. ; Contensou, J.
Author_Institution
Austria Mikro Syst. Int. AG, Unterpremstatten, Austria
fYear
1997
fDate
17-20 Mar 1997
Firstpage
573
Lastpage
580
Abstract
IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program
Keywords
analogue integrated circuits; integrated circuit manufacture; mixed analogue-digital integrated circuits; production testing; quality control; IC product quality; analogue ICs; inductive fault analysis; manufacturing test program; mixed-signal ICs; quality estimation methodology; quality related parameters; Analog integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Circuits and systems; Integrated circuit modeling; Integrated circuit testing; Production; System testing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location
Paris
ISSN
1066-1409
Print_ISBN
0-8186-7786-4
Type
conf
DOI
10.1109/EDTC.1997.582419
Filename
582419
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