DocumentCode :
3436599
Title :
RELSPEC: A Framework for Early Reliability Refinement of Embedded Applications
Author :
Ghosh, S.K. ; Hazra, A. ; Dey, S.
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, Kharagpur, India
fYear :
2015
fDate :
3-7 Jan. 2015
Firstpage :
41
Lastpage :
46
Abstract :
The increasing complexity of safety-critical embedded applications have made it imperative to specify and analyze reliability upfront in the design flow so that reliable systems can be automatically synthesized adhering to such descriptions. This paper develops a framework, RELSPEC, to express the reliability of a safety-critical embedded application at an early-stage of the design flow and enables the reliability analysis leveraging automatically constructed intermediate probabilistic models of the system. Further, our analysis provides a mechanized way to refine the reliability in order to meet a target reliability value of the overall system. Experiments over few automotive case-studies show the efficacy of this methodology.
Keywords :
automotive engineering; embedded systems; probability; safety-critical software; software reliability; RELSPEC; automatically constructed intermediate probabilistic models; automotive case-studies; design flow; early reliability refinement; safety-critical embedded application; Analytical models; Computational modeling; Markov processes; Probabilistic logic; Reliability engineering; Standards; Embedded Systems; Reliability; Specification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design (VLSID), 2015 28th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Type :
conf
DOI :
10.1109/VLSID.2015.12
Filename :
7031705
Link To Document :
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