Abstract :
The following topics are dealt with: ATE systems; software tools and approaches; advanced instrument networking LXI; diagnostics design; systems engineering; ATML and related standards; synthetic instruments; lifecycle management; advanced electro optical test systems; instrument bus interfaces; TPS design and development; microwave technologies; knowledge management; ATS management and modernization; system software considerations; organizational-level/field testing; instrument capability with embedded processing; modeling approaches; advanced test methods; commercial technologies in system design; diagnostics and repair approaches; managing legacy requirements in a modern architecture; ATE system design and support; ATS software technologies; system hardware and interconnections; TPS software design/architecture; innovative design techniques; net-centric data; test techniques using PXI; circuit board testing techniques; software interfaces and standards; using diagnostic results; PXI test solutions
Keywords :
automatic test equipment; electronic equipment testing; microwave technology; peripheral interfaces; printed circuit testing; program diagnostics; software architecture; software maintenance; software standards; software tools; ATE system support; ATE systems; ATML; ATS management; ATS modernization; ATS software technologies; LXI; PXI test solutions; TPS design; TPS development; TPS software; advanced electro optical test systems; advanced instrument networking; advanced test methods; circuit board testing; commercial technologies; diagnostic results; diagnostics design; embedded processing; field testing; innovative design techniques; instrument bus interfaces; instrument capability; knowledge management; legacy requirements; lifecycle management; microwave technologies; modeling approaches; net-centric data; organizational-level testing; repair approaches; software interfaces; software standards; software tools; synthetic instruments; system design; system hardware; system interconnections; system software considerations; systems engineering;
Conference_Titel :
Autotestcon, 2005. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9101-2
DOI :
10.1109/AUTEST.2005.1609069
