DocumentCode
3436895
Title
Author index
fYear
2003
fDate
1-1 May 2003
Firstpage
431
Lastpage
432
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2003. Proceedings. 21st
Conference_Location
Napa, CA, USA
ISSN
1093-0167
Print_ISBN
0-7695-1924-5
Type
conf
DOI
10.1109/VTEST.2003.1197684
Filename
1197684
Link To Document