DocumentCode :
3436917
Title :
Sensitivity analysis of PCB´s design parameters of the plated through hole
Author :
Chenyan Liu ; Weiwei Hu ; Yufeng Sun
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2013
fDate :
15-18 July 2013
Firstpage :
489
Lastpage :
492
Abstract :
As the demand grows for multiple functionality and high density, the reliability of plated through hole (PTH) becomes a concern because of the difficulty in small window plating. Choosing a favorable stress-strain model is an important part of PTH´s reliability assessment. In this paper, the stress-strain model of Mirman and enhanced IPC (Association Connecting Electronics Industries) are considered to analyze the sensitivity of geometric parameters, the finite element analysis (FEA) data is used to verify the above results. In conclusion, the enhanced IPC model is more suitable for analyzing the influence of geometric parameters on PTH than Mirman model. And most of analysis results calculated by the enhanced IPC model are consistent with FEA´s results. The analysis results also provide a reference for the selection of geometric parameters.
Keywords :
finite element analysis; printed circuit design; reliability; sensitivity analysis; stress-strain relations; FEA; Mirman model; PCB design parameters; enhanced IPC model; finite element analysis; plated through hole; reliability assessment; sensitivity analysis; small window plating; stress-strain model; Analytical models; Data models; Mathematical model; Reliability; Sensitivity; Strain; Stress; PTH; finite element analysis; sensitivity analysis; stress-strain model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
Type :
conf
DOI :
10.1109/QR2MSE.2013.6625629
Filename :
6625629
Link To Document :
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