Title :
March LA: a test for linked memory faults
Author :
van de Goor, A.J. ; Gaydadjiev, G.N. ; Yarmolik, V.N. ; Mikitjuk, V.G.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults
Keywords :
fault diagnosis; integrated circuit testing; integrated memory circuits; March LA; linked fault; memory testing; simple fault; Electrical fault detection; Fault detection; Informatics; Information technology; Sociotechnical systems; Software testing;
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7786-4
DOI :
10.1109/EDTC.1997.582440
