• DocumentCode
    3436985
  • Title

    Piezoelectric cantilever array for multiprobe scanning force microscopy

  • Author

    Itoh, Takayuki ; Ohashi, Takahiro ; Suga, Takashi

  • Author_Institution
    Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
  • fYear
    1996
  • fDate
    11-15 Feb 1996
  • Firstpage
    451
  • Lastpage
    455
  • Abstract
    This paper attempts to describe a newly conceived multiprobe scanning force microscope (SFM) using a microfabricated piezoelectric cantilever. An array of piezoelectric microcantilevers with a piezoelectric ZnO layer on a SiO2 film makes it possible to build the multiprobe SFM system. The piezoelectric cantilever is suitable for each cantilever of the array in the multiprobe SFM, because it can be utilized for both dynamic force sensing and controlling the tip-sample spacing. We have verified die applicability of the piezoelectric cantilever to each cantilever of the multiprobe array by characterizing tile sensitivities of the deflection sensing and actuation in z-direction. The 125-μm-long cantilever could be statically driven by applying dc voltages to the piezoelectric layer, where the sensitivity of static drive was 20 nm/V. We have also fabricated an experimental piezoelectric microcantilever arrays with ten cantilevers. The mechanical resonance property of the cantilevers of the array has been studied
  • Keywords
    atomic force microscopy; elemental semiconductors; force measurement; micromachining; microsensors; piezoelectric thin films; semiconductor technology; silicon; silicon compounds; spatial variables measurement; zinc compounds; 125 mum; Si; SiO2 film; ZnO-SiO2; dc voltages; deflection sensing; dynamic force; mechanical resonance; microfabricated piezoelectric cantilever; multiprobe SFM; multiprobe scanning force microscopy; piezoelectric ZnO layer; piezoelectric cantilever array; piezoelectric microcantilever arrays; piezoelectric microcantilevers; static drive; tile sensitivities; tip-sample spacing; z-direction; Force control; Force sensors; Lithography; Microscopy; Optical devices; Optical feedback; Optical sensors; Probes; Resonance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1996, MEMS '96, Proceedings. An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems. IEEE, The Ninth Annual International Workshop on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-2985-6
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1996.494024
  • Filename
    494024