• DocumentCode
    3436995
  • Title

    A monolithic off-chip IDDQ monitor

  • Author

    Svajda, M. ; Straka, B. ; Manhaeve, H.

  • Author_Institution
    Tech. Univ. of Brno, Czech Republic
  • fYear
    1997
  • fDate
    17-20 Mar 1997
  • Firstpage
    629
  • Abstract
    An integrated off-chip IDDQ measuring unit (IOCIMU) is described in this paper. The semi-digital current monitor is designed for the use with standard automatic test equipment (ATE). Simulations of the monolithic monitor implemented in a 2-μm BiCMOS technology show an accuracy better than 1% for currents in the range from 0 to 1 mA and a test rate up to 10 kHz
  • Keywords
    BiCMOS integrated circuits; automatic test equipment; electric current measurement; integrated circuit testing; 0 to 1 mA; 10 kHz; 2 micron; BiCMOS technology; IOCIMU; automatic test equipment; integrated off-chip IDDQ measuring unit; monolithic semi-digital current monitor; simulation; test rate; Automatic test equipment; BiCMOS integrated circuits; Capacitance measurement; Computerized monitoring; Current measurement; Measurement units; Microelectronics; Testing; Variable structure systems; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1997. ED&TC 97. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1066-1409
  • Print_ISBN
    0-8186-7786-4
  • Type

    conf

  • DOI
    10.1109/EDTC.1997.582442
  • Filename
    582442
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3436995