DocumentCode :
3436995
Title :
A monolithic off-chip IDDQ monitor
Author :
Svajda, M. ; Straka, B. ; Manhaeve, H.
Author_Institution :
Tech. Univ. of Brno, Czech Republic
fYear :
1997
fDate :
17-20 Mar 1997
Firstpage :
629
Abstract :
An integrated off-chip IDDQ measuring unit (IOCIMU) is described in this paper. The semi-digital current monitor is designed for the use with standard automatic test equipment (ATE). Simulations of the monolithic monitor implemented in a 2-μm BiCMOS technology show an accuracy better than 1% for currents in the range from 0 to 1 mA and a test rate up to 10 kHz
Keywords :
BiCMOS integrated circuits; automatic test equipment; electric current measurement; integrated circuit testing; 0 to 1 mA; 10 kHz; 2 micron; BiCMOS technology; IOCIMU; automatic test equipment; integrated off-chip IDDQ measuring unit; monolithic semi-digital current monitor; simulation; test rate; Automatic test equipment; BiCMOS integrated circuits; Capacitance measurement; Computerized monitoring; Current measurement; Measurement units; Microelectronics; Testing; Variable structure systems; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1997. ED&TC 97. Proceedings
Conference_Location :
Paris
ISSN :
1066-1409
Print_ISBN :
0-8186-7786-4
Type :
conf
DOI :
10.1109/EDTC.1997.582442
Filename :
582442
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3436995
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