DocumentCode
3436999
Title
Molecular beam epitaxy of GaN/AlGaN multiple quantum wells: Application to near-infrared intersubband transitions (1.5-4.2 μm)
Author
Ng, H.M. ; Gmachl, C. ; Chu, S.N.G. ; Cho, A.Y.
Author_Institution
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
fYear
2000
fDate
2000
Firstpage
245
Lastpage
249
Abstract
High quality GaN/AlGaN multiple quantum wells were grown by molecular beam epitaxy on (0001) sapphire substrates. The GaN wells range in thickness between 10 and 30 Å while the AlGaN composition of the barriers was varied between 45 and 85%. Structural studies by cross-sectional transmission electron microscopy show that the GaN/AlGaN interfaces are abrupt with thickness uniformity on the order of one (Al)GaN monolayer. Intersubband absorption was observed between 1.5 to 4.2 μm depending on the well thickness and barrier height. This is the first observation of intersubband absorption at a wavelength as short as 1.5 μm for the III-nitrides material system
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; infrared spectra; interface structure; molecular beam epitaxial growth; optical materials; semiconductor growth; semiconductor quantum wells; transmission electron microscopy; wide band gap semiconductors; 1.5 to 4.2 micron; Al2O3; AlGaN barrier composition; GaN well thickness; GaN-AlGaN; GaN/AlGaN interfaces; GaN/AlGaN multiple quantum wells; barrier height; cross-sectional transmission electron microscopy; intersubband absorption; molecular beam epitaxy; near-infrared intersubband transitions; Absorption; Aluminum gallium nitride; Gallium nitride; Molecular beam epitaxial growth; Nitrogen; Plasma temperature; Quantum well devices; Scanning electron microscopy; Substrates; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductors, 2000 IEEE International Symposium on
Conference_Location
Monterey, CA
Print_ISBN
0-7803-6258-6
Type
conf
DOI
10.1109/ISCS.2000.947162
Filename
947162
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