• DocumentCode
    3436999
  • Title

    Molecular beam epitaxy of GaN/AlGaN multiple quantum wells: Application to near-infrared intersubband transitions (1.5-4.2 μm)

  • Author

    Ng, H.M. ; Gmachl, C. ; Chu, S.N.G. ; Cho, A.Y.

  • Author_Institution
    Lucent Technol. Bell Labs., Murray Hill, NJ, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    245
  • Lastpage
    249
  • Abstract
    High quality GaN/AlGaN multiple quantum wells were grown by molecular beam epitaxy on (0001) sapphire substrates. The GaN wells range in thickness between 10 and 30 Å while the AlGaN composition of the barriers was varied between 45 and 85%. Structural studies by cross-sectional transmission electron microscopy show that the GaN/AlGaN interfaces are abrupt with thickness uniformity on the order of one (Al)GaN monolayer. Intersubband absorption was observed between 1.5 to 4.2 μm depending on the well thickness and barrier height. This is the first observation of intersubband absorption at a wavelength as short as 1.5 μm for the III-nitrides material system
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; infrared spectra; interface structure; molecular beam epitaxial growth; optical materials; semiconductor growth; semiconductor quantum wells; transmission electron microscopy; wide band gap semiconductors; 1.5 to 4.2 micron; Al2O3; AlGaN barrier composition; GaN well thickness; GaN-AlGaN; GaN/AlGaN interfaces; GaN/AlGaN multiple quantum wells; barrier height; cross-sectional transmission electron microscopy; intersubband absorption; molecular beam epitaxy; near-infrared intersubband transitions; Absorption; Aluminum gallium nitride; Gallium nitride; Molecular beam epitaxial growth; Nitrogen; Plasma temperature; Quantum well devices; Scanning electron microscopy; Substrates; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 2000 IEEE International Symposium on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-6258-6
  • Type

    conf

  • DOI
    10.1109/ISCS.2000.947162
  • Filename
    947162